With ici:microscopy AIT offers a powerful solution that combined 2D and 3D inspection in inline microscopy, allowing the inspection of microscopic features and defects. With sampling rates down to 700nm and the ability to deliver up to 60 million registered 2D image pixels and 3D points per second, the technology offers unparalleled accuracy. The system is largely independent of the surface properties of the materials under inspection.
Hall 8 | Booth C50